PAVAN, B. V. V. S. R. K. K. .; RANI, P. E. . Detection and Classification of the Schizophrenia with Ocular Artifacts Removal in EEG Signal with Darknet YOLO architecture. International Journal of Intelligent Systems and Applications in Engineering, [S. l.], v. 12, n. 1s, p. 647–662, 2023. Disponível em: https://ijisae.org/index.php/IJISAE/article/view/3500. Acesso em: 22 jul. 2024.