PATEL, K. .; PATEL, A. . LeafGuard: Efficient Soybean Leaf Defect Classification in Indian Agriculture Using Fine-tuned CNN. International Journal of Intelligent Systems and Applications in Engineering, [S. l.], v. 12, n. 16s, p. 16–24, 2024. Disponível em: https://ijisae.org/index.php/IJISAE/article/view/4778. Acesso em: 22 jul. 2024.