B P SWATHI. Silicon Wafer Fault Detection Using Machine Learning Techniques . International Journal of Intelligent Systems and Applications in Engineering, [S. l.], v. 12, n. 3, p. 3059–3068, 2024. Disponível em: https://ijisae.org/index.php/IJISAE/article/view/5897. Acesso em: 22 jul. 2024.