HAMEED UL HASSAN MOHAMMED. A Data-Driven Framework for Predicting Defect Density in Semiconductor Wafer Fabrication using Ensemble Learning. International Journal of Intelligent Systems and Applications in Engineering, [S. l.], v. 9, n. 4, p. 429 –, 2021. Disponível em: https://ijisae.org/index.php/IJISAE/article/view/7809. Acesso em: 11 sep. 2025.