HAMEED UL HASSAN MOHAMMED. Challenges And Solutions in Post-Manufacturing Testing of System-On-Chip (SOC) Devices. International Journal of Intelligent Systems and Applications in Engineering, [S. l.], v. 8, n. 4, p. 386 –, 2020. Disponível em: https://ijisae.org/index.php/IJISAE/article/view/7810. Acesso em: 11 sep. 2025.