PATHAK, K. R. .; HANEEF, F. . Analysis of Stress Using Electroencephalogram Data for Feature Extraction. International Journal of Intelligent Systems and Applications in Engineering, [S. l.], v. 11, n. 11s, p. 01–05, 2023. Disponível em: https://ijisae.org/index.php/IJISAE/article/view/3429. Acesso em: 20 may. 2024.