Hameed Ul Hassan Mohammed. “A Data-Driven Framework for Predicting Defect Density in Semiconductor Wafer Fabrication Using Ensemble Learning”. International Journal of Intelligent Systems and Applications in Engineering 9, no. 4 (November 30, 2021): 429 –. Accessed September 11, 2025. https://ijisae.org/index.php/IJISAE/article/view/7809.