Implementation of Low Speed Dynamic Comparator with Double Tail Cascode Cross-Coupled Pair to Enhance Gain
Keywords:
low-noise, Comparator, low-power, double tail latch-type comparator.Abstract
The dynamic comparator with low performance is designed with a 28 nm CMOS process with a supply voltage of 1.1 V, and is compared to a wide range of double-tail comparator for power consumption and RMS noise with input. Adding a cross-coupling device to I/P differential couple prevents the internal comparison node from being completely unloaded, as opposed to traditional architectures. This reduces power consumption and achieves similar noise levels at the same time. Measurements show that the proposed comparator achieves an input noise of 230 µV. that suppress power reductions by 50%. The proposed circuit consumes 0.198pJ energy per comparison.
Downloads
References
M. Liu, K. Pelzers, R. van Dommele, A. van Roermund, and P. Harpe,“A 106nW 10b 80kS/s SAR ADC with duty-cycled reference generation 65 nm CMOS,” IEEE J. Solid-State Circuits, vol. 51, no. 10,pp. 2435–2445, Oct. 2016.
P. Harpe, E. Cantatore, and A. V. Roermund, “A 2.2/2.7fJ/conversion-step 10/12b 40kS/s SAR ADC with data-driven noise reduction,” in IEEE Int. Solid-State Circuits Conf. (ISSCC) Dig. Tech. Papers, San Francisco, CA, USA, Feb. 2013, pp. 270–271.
H. S. Bindra, C. E. Lokin, A.-J. Annema, and B. Nauta, “A 30fJ/comparison dynamic bias comparator,” in Proc. 43rd IEEE Eur. Solid State Circuits Conf. (ESSCIRC), Sep. 2017, pp. 71–74.
V. Katyal, R. L. Geiger, and D. Chen, “A new high precision low offset dynamic comparator for high resolution high speed ADCs,” in Proc. Asia Pacific Conf. Circuits Syst., Singapore, 2006, pp. 5–8.
A. Nikoozadeh and B. Murmann, “An analysis of latch comparator offset due to load capacitor mismatch,” IEEE Trans. Circuits Syst. II, Exp. Briefs, vol. 53, no. 12, pp. 1398–1402, Dec. 2006.
T. B. Cho and P. R. Gray, “A 10b, 20 Msample/s, 35 mW pipeline A/D converter,” IEEE J. Solid-State Circuits, vol. 30, no. 3, pp. 166–172, Mar. 1995
J. Doernberg, P. R. Gray, and D. A. Hodges, “A 10-Bit 5-Msample/s CMOS two-step flash ADC,” IEEE J. Solid-State Circuits, vol. 24, no. 2, pp. 241–249, Apr. 1989.
K. Uyttenhove and M. S. J. Steyaert, “Speed-power accuracy tradeoff in high-speed CMOS ADCs,” IEEE Trans. Circuits Syst. II, Analog Digit. Signal Process., vol. 49, no. 3, pp. 280–287, Mar. 2002.
Y. Lin, D. J. Chen, and R. Geiger, “Yield enhancement with optimal area allocation for ratio critical analog circuits,” IEEE Trans. Circuits Sys. I, Reg. Papers, vol. 53, no. 3, pp. 534–553, Mar. 2006.
Downloads
Published
How to Cite
Issue
Section
License

This work is licensed under a Creative Commons Attribution-ShareAlike 4.0 International License.
All papers should be submitted electronically. All submitted manuscripts must be original work that is not under submission at another journal or under consideration for publication in another form, such as a monograph or chapter of a book. Authors of submitted papers are obligated not to submit their paper for publication elsewhere until an editorial decision is rendered on their submission. Further, authors of accepted papers are prohibited from publishing the results in other publications that appear before the paper is published in the Journal unless they receive approval for doing so from the Editor-In-Chief.
IJISAE open access articles are licensed under a Creative Commons Attribution-ShareAlike 4.0 International License. This license lets the audience to give appropriate credit, provide a link to the license, and indicate if changes were made and if they remix, transform, or build upon the material, they must distribute contributions under the same license as the original.