Sizing of Dual-Stage Operational Amplifiers through PVT-Aware Circuit Optimization in 0.18μm CMOS Technology
Keywords:
CS, PSO, PVT, TTAAbstract
This study examines the effects of Process, Supply Voltage, and Temperature (PVT) fluctuations on the design of analog circuits based on CMOS technology. The paper initially discusses the impact of PVT changes on the efficiency of analog circuits based on CMOS technology. Subsequently, the text examines the enhancement of these circuits, specifically emphasizing on two-stage operational amplifier (op-amp) circuits and their efficacy in the face of PVT fluctuations. The paper explores the complex correlation between PVT variations and analog circuit design utilizing CMOS technology, emphasizing the difficulties presented by elaborate manufacturing processes, fluctuations in supply voltage, and changes in temperature. These differences have the potential to greatly modify the behavior of the circuit, which can impact the dependability and consistency of the designs. The project seeks to optimize CMOS-based two-stage op-amp circuits in order to improve their performance in different PVT settings. The cuckoo search (CS) method exhibited exceptional efficacy in circuit optimization, resulting in a notable decrease in the Total Transistor Area (TTA) to 14.12 µm². In addition, the hybrid cuckoo search particle swarm optimization (CSPSO) method demonstrated favorable outcomes, satisfying the circuit parameters requirements in 6 out of 10 separate trials. The article presents strategic optimization techniques to assist engineers and researchers in creating resilient analog systems that can efficiently adjust to dynamic PVT conditions.
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